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Some oscilloscopes offer additional functions such as waveform generator, spectrum analyzer, logic analyzer, protocol analyzer, digital voltmeter and counter. Read more...
Latest Oscilloscope News |
Teledyne LeCroy launches High Voltage optically Isolated Probe
16 January 2017 - Teledyne LeCroy announces the new HVFO high voltage fiber-optically isolated oscilloscope probe. The HVFO probe further extends Teledyne LeCroy’s market leadership in the power electronics market, adding to other unique solutions such as the only HV differential probe rated for 1500Vdc common-mode testing, the industry’s only 8-channel, 12-bit resolution oscilloscopes, and Motor Drive Analyzers for three-phase electrical and mechanical power measurements.
Automated USB 3.1 Type-C Test Solution
02 January 2017 - Tektronix announced an automated USB 3.1 Type-C transmitter test solution for Gen1 and Gen 2 that combines full SigTest support with DPOJET debug and analysis tools, allowing designers to bring devices with improved margins to market in less time. The new solution delivers 100 percent compliance test coverage as well as full support for the new Type-C connector, fixtures and associated channel tests.
Multifunctional 100 MHz Oscilloscope
02 December 2016 - Peaktech launched a new digital storage oscilloscope featuring 100MHz bandwith, 12 bit vertical resolution and a 8" touchscreen. In addition to the 2-channel oscilloscope a full digital multimeter for voltage, current, resistance and capacitance measurements is integrated. Additionally arbitrary waveforms can be outputted with the integrated 25MHz waveform generator.
400G PHY Layer PAM4 Transmitter Validation
01 December 2016 - Tektronix released an update to its PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX oscilloscope series. The latest release adds PAM4 error detection, industry-leading Signal to Noise and Distortion Ratio (SNDR) measurement capability, and new advanced FFE/DFE equalization capabilities into one easy to use solution.
Entry-level DSO featuring 7" Display and Standard LAN
29 November 2016 - B&K Precision replaced their former 2190D bench digital storage oscilloscope (DSO) with the model 2190E. Offering the same measurement capabilities of the previous 2190D, the 2190E continues to add more features to the entry-level 100 MHz DSO. New upgrades include a higher resolution display and standard LAN interface at no additional cost.
Teledyne LeCroy launches Active Voltage Rail Probe and SPMI Decoder
14 November 2016 – Teledyne LeCroy launched two new products – the RP4030 active voltage rail probe and an industry first MIPI System Power Management Interface (SPMI) serial decoder. The RP4030 probe measures small signal variations on a DC power/voltage rail, while the SPMI decoder monitors and correlates SPMI serial bus messages with DC power/voltage rail changes. These two products are ideal for testing line or battery-powered computing and embedded systems that use digital power management ICs (PMICs) to reduce power consumption and increase system efficiency.
Test Solution for ONFI Flash Memory Standard
07 November 2016 – Tektronix announced the industry’s first test solution for the Open NAND Flash Interface (ONFI) standard. Available for Tektronix high-performance oscilloscopes, the ONFI 4.0 test solution includes software for analyzing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
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Oscilloscope Background |
Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyzer?
Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue.
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