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Latest Oscilloscope News |
DDR4 BGA Interposers for Infiniium Series Oscilloscopes
17 September 2014 - Keysight Technologies introduced DDR4 ball-grid array (BGA) probe interposer solutions for Infiniium Series oscilloscopes. Engineers can use the probes and oscilloscopes for debugging and characterizing DDR4 memory designs and testing device compliance with the JEDEC DDR4 standard.
NI announces new Software-Designed Instruments
11 September 2014 – National Instruments announced a range of new software-designed instrument: 8-channel oscilloscope, RF vector signal analyzer, frequency digitizer and a high-speed serial instrument. Two years ago, NI introduced the first software-designed instrument, the vector signal transceiver.
User-Extensible Frequency Domain Analysis for Real-Time Oscilloscopes
04 September 2014 – Keysight Technologies announced the availability of a frequency domain analysis (FDA) option, the industry’s first user-extensible spectrum frequency domain analysis application solution for real-time oscilloscopes. The FDA option extends the capabilities of Keysight Infiniium and InfiniiVision Series oscilloscopes by enabling engineers to acquire live signals from the oscilloscope and visualize them in the frequency domain as well as make key frequency domain measurements.
100 MHz Oscilloscope with 1 GSa/s Sampling Rate and 40 Kpts Waveform Memory
01 September 2014 -- B&K Precision introduces the new 2190D bench digital storage oscilloscope (DSO). This compact dual-channel DSO offers several measurement functions with 100 MHz bandwidth and 1 GSa/s sampling rate. Building on the success of the discontinued analog model 2190B oscilloscope, the 2190D now provides users with digital features including a 7” widescreen color display, waveform memory up to 40,000 points, pass/fail limit testing, digital filtering, waveform recorder, and 32 automatic measurements.
Compact Digital Storage Oscilloscopes
21 August 2014 - GW Instek introduced a new-generation of digital oscilloscopes. The GDS-200/300 series oscilloscopes are equipped with USB storage function and can be positioned in portrait and landscape display. The recharging-battery design makes the series easy to operate for field operations. The GDS-200/300 series are applicable in laboratories, R&D, large electric system tests, power product tests, motor tests, solar power battery inspection and repair, and maintenance personnel who are always on field assignments.
100G Ethernet Compliance Test Applications
07 August 2014 – Agilent / Keysight introduced the industry’s first 
compliance test applications for 100 Gigabit Ethernet networking systems. The Agilent N8830A 100GBASE-CR4, N8829A 100GBASE-KR4 and N8828A 40GBASE-CR4/100GBASE-CR10 test applications help network-design engineers accelerate turn-on and debugging of 100G Ethernet networking systems. The new applications automate the execution of physical-layer tests on Agilent Infiniium 90000 X-Series and 90000 Q-Series oscilloscopes and the new Z-Series oscilloscopes with up to 63-GHz bandwidth.
Automated APCO P25 Transmitter Compliance Testing
05 August 2014 – Tektronix announced a cost-effective compliance transmitter test solution for the Project 25 (P25) Common Air Interface (CAI) Phase 1 and Phase 2 standard. The new software gives RF test engineers and safety agencies the convenience of push-button measurements with automated pass/fail reporting and runs on Tektronix spectrum analyzers , all Tektronix Windows-based oscilloscopes, and on SignalVu-PC linked with the MDO4000B Mixed Domain Oscilloscope Series.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
Oscilloscope Background |
Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyzer?
Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue.