Did you know? |
An oscilloscope can only measure the signal that the probe delivers to its input. Choosing the right probe is therefore essential to ensure a high signal fidelity and measurement accuracy. Read more...
Latest Oscilloscope News |
Teledyne LeCroy launches Active Voltage Rail Probe and SPMI Decoder
14 November 2016 – Teledyne LeCroy launched two new products – the RP4030 active voltage rail probe and an industry first MIPI System Power Management Interface (SPMI) serial decoder. The RP4030 probe measures small signal variations on a DC power/voltage rail, while the SPMI decoder monitors and correlates SPMI serial bus messages with DC power/voltage rail changes. These two products are ideal for testing line or battery-powered computing and embedded systems that use digital power management ICs (PMICs) to reduce power consumption and increase system efficiency.
Test Solution for ONFI Flash Memory Standard
07 November 2016 – Tektronix announced the industry’s first test solution for the Open NAND Flash Interface (ONFI) standard. Available for Tektronix high-performance oscilloscopes, the ONFI 4.0 test solution includes software for analyzing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
Oscilloscope Probe for Voltages in the Millivolt Range
04 November 2016 - The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz f is ideal for measuring smallest signals down to 1 mV/div, e.g. for power integrity measurements on integrated circuits and components. The new passive 1:1 probe is precisely matched to the R&S RTE (up to 2 GHz) and the R&S RTO1000/2000 (up to 4 GHz) oscilloscopes.
DisplayPort Type-C Transmitter Test Solution
03 November 2016 – Tektronix announced a new DisplayPort Type-C Transmitter Test solution that significantly reduces compliance test times compared to both previous Tektronix DisplayPort solution and those available from competitors. According to real-world field evaluations, the highly optimized solution for use with Tektronix high-performance oscilloscopes allows engineers to complete the full suite of DisplayPort Type C compliance tests in less than 6 hours compared to competitive offerings that require up to 16 hours to complete -- a remarkable execution speed.
Debugging of complex 100G Datacenter Interconnects
01 November 2016 – Tektronix released a new 100G link training tool for use with its DPO70000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing datacenter market. The expanded analysis software for DPO70000SX series oscilloscopes helps engineers to debug complex high-speed Ethernet communications links.
Test Probes for Signals up to 18 Gb/s
31 October 2016 - Pico Technology launched a new family of high-performance microwave and gigabit test probes. The PicoConnect passive probes allow cost-effective fingertip browsing of broadband signals or data streams out to 9 GHz or 18 Gb/s. These include the now ubiquitous USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards.
High-Speed, High-Resolution, High-Voltage PXIe Oscilloscope
26 October 2016 – National Instruments (NI) announced the PXIe-5164 oscilloscope featuring 100 Vpp maximum input range at 1 GS/s and 14 bits resolution. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.
Oscilloscope Basics |
Digitizer and Oscilloscope - Equal Alternatives?
Can a digitizer be used as an oscilloscope? What is the difference between an oscilloscope and a digitizer? Should I better use a digitizer or an oscilloscope in my next application? These are interesting questions and the best way to start to answer these is the look up the dictionary definition of an oscilloscope: "An electronic instrument used to measure changing electric voltages. It displays the waveforms of electric oscillations on a screen."
Read more ...
Oscilloscope Background |
Precision Phase Noise Measurement with an Oscilloscope - Part 1
Often clock jitter induced from the power supply noise, signal routings, or other signals severely degrade the performance of the system. Clock generation and distribution in a FPGA for a high speed analog application is particularly prone to these issues. They manifest themselves in phase noise or clock jitter, which is the random variation of the period of a signal over time. Clearly, optimization of the design requires verification of the integrity of such clocks.
Read more ...