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LeCroy built 1971 the first real-time digital oscilloscope (WD 2000) with a memory depth of 20 samples and a sampling rate of 1 ns. Read more...
Latest Oscilloscope News |
Tektronix starts Delivery of Optically Isolated Probe System
16 August 2016 - Tektronix started shipping of the IsoVu Measurement System previewed earlier this year at the APEC 2016 show. Pricing for the optically isolated measurement system starts at $12,000. IsoVu Technology combines 1 GHz bandwidth, wide common mode range, with superior Common Mode Rejection to make previously hidden signals visible.
Debugging of MIPI M-PHY Interfaces
03 August 2016 - The new R&S RTO-K44 option from Rohde & Schwarz offers powerful triggering and decoding functionality for debugging designs with MIPI M-PHY based protocols. Defined as a physical layer, M-PHY serves as the basis for a number of protocol standards that have been optimized for rapid data transmission in mobile devices. For example, M-PHY is used together with CSI-3 in cameras and with UFS in memory components for multimedia applications. With DigRF Rev.4, UniPort or LLI, the interface is used in chip-to-chip communications.
Tektronix enhances Portfolio with new basic Oscilloscope
02 August 2016 - Tektronix introduced the TBS2000, a next generation basic oscilloscope featuring the longest record length and largest display in its class for faster signal evaluation and troubleshooting. This latest addition to the Tektronix portfolio puts expanded capabilities, including the ability to use a wide range of Tektronix probes, into the hands of budget-constrained design engineers and educators.
SIGLENT expands SDS1000X Series Digital Oscilloscope Series
06 July 2016 - SIGLENT TECHNOLOGIES introduced the SDS1000X+ Series Super Phosphor Oscilloscope. The new SDS1000X+ is similar to the existing SDS1000X family but includes an option for 16 digital channels (MSO) and also a 25 MHz DDS arbitrary waveform generator as standard feature. The oscilloscope features also automatic measurement functions and advanced math functions.
New Release of BenchVue Software enables Data Logging with Oscilloscopes
05 July 2016 - Keysight Technologies announced the latest release of its popular BenchVue software; an intuitive, easy-to-use platform for the PC. BenchVue provides multiple-instrument measurement applications, data capture and solution applications, without the need for instrument programming. BenchVue also supports data logging for instruments, such as oscilloscopes.
PCI Express 4.0 Test Solution supports 16 GT/s Data Rates
04 July 2016 - Tektronix announced a series of enhancements to its suite of PCI Express (PCIe) test solutions including support for the 16 GT/s data rate and the industry’s first automated transmitter and receiver test solutions supporting the PCIe 4.0 architecture. With the faster data rates for PCIe 4.0 technology come new test challenges such as major increases in channel loss, tightening of the total jitter budget and more complex link training and timing requirements.
Eye Diagrams for Serial Trigger & Decode Solutions
27 June 2016 - Teledyne LeCroy expands the Serial Data Analysis capabilities for its oscilloscope solutions by introducing as first oscilloscope manufacturer Eye Diagram capabilities in the new TDME Serial Bus options. Eye parameters can be used to quantify system performance and apply a standard or custom mask to identify anomalies. Mask failures can be indicated and can force the scope into Stop mode.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
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Oscilloscope Background |
Precision Phase Noise Measurement Technique - Part 2
In the first part of this article a simple phase noise measurement technique with a resolution of 10 ps was explained. There are other techniques, which could enhance the performance of the measurement to sub-picoseconds. That is the subject of this article.
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