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In 2017 Tektronix introduced the FlexChannel technology for its 5 Series oscilloscopes. Each channel can be used either as one analog or as 8 digital channels. Read more...
Latest Oscilloscope News |
Portable Oscilloscope with USB, LAN or WiFi Connection
04 November 2019 - TiePie engineering introduced the WiFiScope series oscilloscopes. The new range WiFi oscilloscopes can be used via an ethernet connection (LAN, WiFi or WAN) but also still with a USB 2.0 / 3.0 connection. The built-in battery gives the WiFiScope the possibility to perform fully wireless measurements. Measurements can then be performed completely galvanically isolated, and over long distances.
200 MHz 2-Channel Oscilloscope with 24MPts Memory
30 October 2019 - RIGOL Technologies expands its oscilloscope portfolio with the new DS1202Z-E 200MHz Oscilloscope. The DS1202Z-E comes standard with 2 analog channels, 24MPts of deep memory, a 60,000 frame segmented record mode, standard serial decode and triggering, high resolution FFT, 15 trigger types and 37 integrated measurements making the DS1202Z-E a powerful and capable debug tool for design engineers.
Differential Probes with Bandwidth up to 25 GHz
29 October 2019 – Teledyne LeCroy announced the DH Series of differential probes, which come in bandwidths from 13 GHz to 25 GHz to address high-speed serial data debug and validation. The probes offer exceptionally low loading (200 kΩ DC), low noise, and a range of available tips for application flexibility.
GW Instek added new Mixed-Domain Oscilloscope
25 October 2019 - The GW Instek MDO-2000A is an advanced version of MDO-2000E mixed-domain oscilloscope. The selectable bandwidth range is upgraded to 300MHz. The full bandwidth ranges include 300MHz, 200MHz and 100MHz. The sampling rate has upgraded to max. 2GSa/s and the memory depth has also been upgraded to 20M/CH. Hence, the three major specifications of oscilloscopes have been improved.
Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices
23 October 2019 - Tektronix offers a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods. Measurements are taken with an oscilloscope.
I3Cbus Trigger, Decode, Measure, Eye Diagram Solution
15 October 2019 - The new I3C Trigger+Decode (TD) option for Teledyne LeCroy Oscilloscopes provides high performance triggers and transparent color-coded decode overlays, protocol tables, and search capabilities. The also new TDME option adds Measure/Graph (M) capability with automated measurement and graphing tools and Eye Diagram (E) capability for physical layer signal assessment and debug. Extract digital sensor data and plot it as a waveform. Easily correlate I3C traffic to other signals in mobile, handheld, and battery-powered embedded systems.
Motor Drive Analyzer with 8 analog Channels
03 October 2019 – Teledyne LeCroy announced its new MDA 8000HD Motor Drive Analyzers, which leverage the new WaveRunner 8000HD High Definition Oscilloscope (HDO) platform of 8 analog channels, 12-bit vertical resolution at all times, up to 5 Gigapoints of acquisition memory (1.25 Gigapoints on all 8 channels), 10 GS/s sample rate, and bandwidths up to 2 GHz.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
Oscilloscope Background |
Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyzer?
Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue.
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