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Some oscilloscopes offer additional functions such as waveform generator, spectrum analyzer, logic analyzer, protocol analyzer, digital voltmeter and counter. Read more...
Latest Oscilloscope News |
High Resolution Oscilloscopes with 15.4” Display and comprehensive Toolbox
02 April 2019 – Teledyne LeCroy introduced its WaveRunner 9000 Series mixed-signal oscilloscopes with a large, 15.4” display, bandwidths from 500 MHz to 4 GHz, and sample rates up to 40 GS/s. The WaveRunner 9000 Series offers the industry’s deepest toolbox and the most complete collection of serial data debug and validation solutions, making it ideal for embedded system, automotive, and EMC/EMI test applications.
Learning Module including an Oscilloscope and other Instruments
01 April 2019 - Analog Devices offers the active learning module ADALM2000, which helps students to design and test analog circuits in real time, utilizing the power of traditional lab equipment made available with graphical application software. The ADALM2000 Active Learning Module is a cost-effective, USB-powered software-defined instrument that brings the power of traditional lab equipment to the palm of your hand.
Combination of 4ch Sampling Oscilloscope and Bit Error Rate Tester
27 March 2019 – Anritsu introducted a four-channel (4ch) sampling oscilloscope option for the BERTWave MP2110A, enabling integration of multi-channel oscilloscope and BERT (Bit Error Rate Tester) in an-all-in-one unit. With this new oscilloscope option, Anritsu further extends its line of test solutions for development and production of optical modules.
Real Time Sampling Oscilloscope with four 5 GHz 12 Bit Channels
28 February 2019 - Pico Technology introduced the PicoScope 9404 SXRTO (Sampler eXtended Real Time Oscilloscope). The 9404 features four 5 GHz 12-bit channels, each supported by real-time sampling to 500 MS/s per channel and up to 1 TS/s (1 ps) equivalent-time sampling. Both the voltage and timing resolution specifications are characteristics of the highest performance broadband oscilloscopes.
Rohde & Schwarz makes 16-bit HD mode standard on most oscilloscopes
27 February 2019 - Rohde & Schwarz announced that starting immediately, all R&S RTO and R&S RTP oscilloscopes are delivered with the high definition mode featuring 16-bit vertical resolution. Users benefit from more measurement performance at the same price. Higher-resolution waveforms enable more precise analysis of signal details that would otherwise be hidden by noise. Users can trigger on the smallest signal details.
3-Phase Power Analysis Software for Evaluation of Power-Conversion Systems
08 February 2019 - Teledyne LeCroy launched its 3-Phase Power Analysis software package, which brings 1-phase and 3-phase static and dynamic power analysis to its HDO8000A, HDO6000A and WavePro HD 12-bit High Definition oscilloscopes.
Comprehensive DDR5 Testing Solution
06 February 2019 - Keysight Technologies announced the industry's first comprehensive double data rate (DDR) 5.0 test solution. Keysight's total solution approach to DDR5 testing includes a new receiver, transmitter, and protocol test solutions. This will enable the ability to perform all test requirements in the DDR5 design specification.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
Oscilloscope Background |
Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyzer?
Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue.
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